WLAN8201CMP

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
NXP has set a standard in the semiconductor business with this detailed level of data, directly retrieved from its general product database.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of WLAN8201CMPLast Revision (GMT):
Monday, 29 May 2023, 04:06:00 AM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
WLAN8201CMPSOT2022HWFLGA3821.418080 mg YesYesYesNickel/Gold (Ni/Au)Othere4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9340 721 635282024-04-16183 / 168 hours26030 sec.3 / 168 hours24020 sec.3External manufacturing
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
CapacitorCeramicBarium and its compoundsBarium titanate12047-27-70.13498799.9900000.630246
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000130.0100000.000063
Subtotal0.135000100.00000000.630309
Copper PlatingCopper and its compoundsCopper, metal7440-50-80.00299999.9900000.014006
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000001
Subtotal0.003000100.00000000.014007
Inner ElectrodeMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000030.0100000.000014
Nickel and its compoundsNickel, metal7440-02-00.02999799.9900000.140055
Subtotal0.030000100.00000000.140069
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000001
Nickel and its compoundsNickel, metal7440-02-00.00299999.9900000.014006
Subtotal0.003000100.00000000.014007
Outer ElectrodeMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000060.0100000.000029
Nickel and its compoundsNickel, metal7440-02-00.06299499.9900000.294115
Subtotal0.063000100.00000000.294144
Tin PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0000010.0100000.000003
Tin and its compoundsTin, metal7440-31-50.00599999.9900000.028011
Subtotal0.006000100.00000000.028014
Die EncapsulantDie EncapsulantAluminum and its compoundsAluminum Hydroxide21645-51-20.1725007.5000000.805394
Epoxy ResinsProprietary Material-Other Epoxy resins0.1610007.0000000.751701
Inorganic Silicon compoundsSilica, vitreous60676-86-01.21785052.9500005.686084
Inorganic Silicon compoundsSilicon dioxide7631-86-90.69000030.0000003.221577
Inorganic compoundsCarbon Black1333-86-40.0126500.5500000.059062
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins0.0460002.0000000.214772
Subtotal2.300000100.000000010.738591
Semiconductor DieDieInorganic Silicon compoundsSilicon7440-21-32.63242598.00000012.290667
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0537232.0000000.250830
Subtotal2.686148100.000000012.541497
Solder BallSilver and its compoundsSilver, metal7440-22-40.0008951.8000000.004178
Tin and its compoundsTin, metal7440-31-50.04882398.2000000.227953
Subtotal0.049718100.00000000.232131
Under Bump MetalCopper and its compoundsCopper, metal7440-50-80.13566895.3973000.633430
Nickel and its compoundsNickel, metal7440-02-00.0062314.3814000.029092
Titanium and its compoundsTitanium, metal7440-32-60.0003150.2213000.001469
Subtotal0.142214100.00000000.663991
Substrate, Pre-plated NiAuCopper FoilCopper and its compoundsCopper, metal7440-50-81.86381499.9900008.702057
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0001860.0100000.000870
Subtotal1.864000100.00000008.702928
Copper PlatingCopper and its compoundsCopper, metal7440-50-85.14508599.99000024.022160
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0005150.0100000.002403
Subtotal5.145600100.000000024.024562
Gold PlatingGold and its compoundsGold, metal7440-57-50.35676499.9900001.665716
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000360.0100000.000167
Subtotal0.356800100.00000001.665882
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0001830.0100000.000853
Nickel and its compoundsNickel, metal7440-02-01.82701799.9900008.530257
Subtotal1.827200100.00000008.531110
Solder MaskBarium and its compoundsBarium sulfate7727-43-70.18941419.6000000.884367
Inorganic Silicon compoundsSilicon dioxide7631-86-90.09664010.0000000.451208
Magnesium and its compoundsTalc14807-96-60.0289923.0000000.135362
Organic compoundsOther organic compounds.0.0550855.7000000.257188
PolymersPlastic: EP - Epoxide, Epoxy0.12176612.6000000.568522
PolymersPlastic: PAK0.47450249.1000002.215429
Subtotal0.966400100.00000004.512076
Substrate CoreInorganic Silicon compoundsFibrous-glass-wool65997-17-31.45504155.3500006.793516
Inorganic Silicon compoundsSilicon dioxide7631-86-90.54468720.7200002.543119
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1516825.7700000.708195
PolymersPlastic: EP - Epoxide, Epoxy0.47739018.1600002.228912
Subtotal2.628800100.000000012.273743
Substrate PrepregInorganic Silicon compoundsFibrous-glass-wool65997-17-30.83491226.0000003.898165
Inorganic Silicon compoundsSilicon dioxide7631-86-91.11749834.8000005.217543
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2793748.7000001.304386
PolymersPlastic: EP - Epoxide, Epoxy0.97941630.5000004.572847
Subtotal3.211200100.000000014.992940
Total21.418080100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 WLAN8201CMP
Product content declaration of WLAN8201CMP
上次修订 Last Revision (GMT):
Monday, 29 May 2023, 04:06:00 AM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
电容器
Capacitor
陶瓷的
Ceramic
OOOOOO

镀铜
Copper Plating
OOOOOO

内电极
Inner Electrode
OOOOOO

镀镍层
Nickel Plating
OOOOOO

外电极
Outer Electrode
OOOOOO

镀锡
Tin Plating
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Die
OOOOOO

焊锡球
Solder Ball
OOOOOO

焊料凸点下的金属
Under Bump Metal
OOOOOO
基板,镍金预镀
Substrate, Pre-plated NiAu
铜箔
Copper Foil
OOOOOO

镀铜
Copper Plating
OOOOOO

镀金材料
Gold Plating
OOOOOO

镀镍层
Nickel Plating
OOOOOO

阻焊层
Solder Mask
OOOOOO

有机基质芯
Substrate Core
OOOOOO

基材预浸料
Substrate Prepreg
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of WLAN8201CMPLast Revision (GMT):
Monday, 29 May 2023, 04:06:00 AM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
CapacitorCERAMICTest Report
21 Jun 2023
Test Report
21 Jun 2023
Test Report
21 Jun 2023
Test Report
21 Jun 2023
CU PLATINGTest Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
INNER ELECTRODETest Report
19 Jul 2023
Test Report
19 Jul 2023
Test Report
19 Jul 2023
Test Report
19 Jul 2023
NI PLATINGTest Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
OUTER ELECTRODETest Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
SN PLATINGTest Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
Test Report
28 Apr 2023
Die EncapsulantTest Report
25 Apr 2023
Test Report
25 Apr 2023
Test Report
25 Apr 2023
Test Report
25 Apr 2023
Semiconductor DieAG PLATINGTest Report
31 Aug 2020
Not AvailableNot AvailableNot Available
COPPER PLATINGTest Report
4 Feb 2021
Test Report
4 Feb 2021
Test Report
4 Feb 2021
Test Report
4 Feb 2021
DIETest Report
19 Jun 2023
Test Report
19 Jun 2023
Test Report
19 Jun 2023
Test Report
19 Jun 2023
NI PLATINGTest Report
28 Jun 2021
Test Report
28 Jun 2021
Test Report
28 Jun 2021
Test Report
28 Jun 2021
SN PLATINGTest Report
31 Aug 2020
Not AvailableNot AvailableNot Available
SNAG1.8Test Report
20 Aug 2021
Test Report
20 Aug 2021
Test Report
20 Aug 2021
Not Available
UBM CUTest Report
16 Dec 2022
Test Report
16 Dec 2022
Test Report
20 Dec 2021
Test Report
20 Dec 2021
UBM TITest Report
16 Dec 2022
Test Report
16 Dec 2022
Test Report
20 Dec 2021
Test Report
20 Dec 2021
Substrate, Pre-plated NiAuAU PLATINGTest Report
17 Feb 2023
Test Report
17 Feb 2023
Test Report
17 Feb 2023
Test Report
17 Feb 2023
AUS SR1Test Report
23 Mar 2023
Test Report
23 Mar 2023
Test Report
23 Mar 2023
Test Report
23 Mar 2023
CU FOILTest Report
27 Jun 2023
Test Report
27 Jun 2023
Test Report
27 Jun 2023
Test Report
27 Jun 2023
CU PLATINGTest Report
21 Sep 2023
Test Report
21 Sep 2023
Test Report
21 Sep 2023
Test Report
21 Sep 2023
HL832NSTest Report
8 Feb 2023
Test Report
8 Feb 2023
Test Report
8 Feb 2023
Test Report
8 Feb 2023
NI PLATINGTest Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
Test Report
10 May 2023
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.