SPC5744CFK1ACMH6

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of SPC5744CFK1ACMH6Last Revision (GMT):
Monday, 10 November 2025, 12:32:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
SPC5744CFK1ACMH6SOT1569LBGA100277.515841 mg YesYesYesNickel/Gold (Ni/Au)Othere2contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 779 095572025-01-16J3 / 168 hours26040 sec.Not ApplicableNot ApplicableNot Applicable3Tianjin, China;Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - CuPdBonding Wire - CuPdCopper and its compoundsCopper, metal7440-50-85.88682598.1000002.121257
Gold and its compoundsGold, metal7440-57-50.0060010.1000000.002162
Palladium and its compoundsPalladium, metal7440-05-30.1080151.8000000.038922
Subtotal6.000841100.00000002.162342
Die EncapsulantDie EncapsulantEpoxy ResinsProprietary Material-Other Epoxy resins6.8600005.0000002.471931
Inorganic Silicon compoundsSilica, vitreous60676-86-091.92400067.00000033.123875
Inorganic Silicon compoundsSilicon dioxide7631-86-934.30000025.00000012.359655
Inorganic compoundsCarbon Black1333-86-40.6860000.5000000.247193
Phenols and Phenolic ResinsProprietary Material-Other phenolic resins3.4300002.5000001.235966
Subtotal137.200000100.000000049.438619
Epoxy AdhesiveEpoxy AdhesiveInorganic Silicon compoundsSilicon dioxide7631-86-90.28800016.0000000.103778
Inorganic Silicon compoundsSilylated silica68909-20-60.66600037.0000000.239986
Organic compoundsOther Bismaleimides0.82800046.0000000.298361
PFAS compoundsEthene, 1,1,2,2-tetrafluoro-, oxidized, polymd., reduced, Me esters, reduced, 2,3-dihydroxypropyl ethers925918-64-50.0180001.0000000.006486
Subtotal1.800000100.00000000.648612
Semiconductor DieSemiconductor DieInorganic Silicon compoundsSilicon7440-21-321.85400098.0000007.874866
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.4460002.0000000.160712
Subtotal22.300000100.00000008.035577
Solder Ball - Lead FreeSolder Ball - Lead FreeAluminum and its compoundsAluminum, metal7429-90-50.0005090.0010000.000183
Antimony and its compoundsAntimony, metal7440-36-00.0254580.0500000.009173
Arsenic and its compoundsArsenic, metal7440-38-20.0152740.0300000.005504
Bismuth and its compoundsBismuth, metal7440-69-90.0152740.0300000.005504
Cadmium and its compoundsCadmium, metal7440-43-90.0010180.0020000.000367
Copper and its compoundsCopper, metal7440-50-80.0152740.0300000.005504
Gold and its compoundsGold, metal7440-57-50.0025460.0050000.000917
Indium and its compoundsIndium, metal7440-74-60.0101830.0200000.003669
Iron and its compoundsIron, metal7439-89-60.0050910.0100000.001835
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0254580.0500000.009173
Nickel and its compoundsNickel, metal7440-02-00.0025460.0050000.000917
Silver and its compoundsSilver, metal7440-22-41.7820253.5000000.642135
Tin and its compoundsTin, metal7440-31-549.01383496.26600017.661635
Zinc and its compoundsZinc, metal7440-66-60.0005090.0010000.000183
Subtotal50.915000100.000000018.346700
Substrate, Pre-plated NiAuCopper FoilCopper and its compoundsCopper, metal7440-50-87.54813599.9900002.719893
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0007550.0100000.000272
Subtotal7.548890100.00000002.720165
Copper PlatingCopper and its compoundsCopper, metal7440-50-817.62043599.9800006.349344
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0035250.0200000.001270
Subtotal17.623960100.00000006.350614
Gold PlatingGold and its compoundsGold, metal7440-57-50.32611799.9900000.117513
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000330.0100000.000012
Subtotal0.326150100.00000000.117525
Nickel PlatingMiscellaneous substancesOther miscellaneous substances (less than 10%).0.0006190.0300000.000223
Nickel and its compoundsNickel, metal7440-02-02.06302199.9700000.743389
Subtotal2.063640100.00000000.743612
Solder MaskAromatic amines and their salts1,3,5-Triazine-2,4,6-triamine108-78-10.0157030.1000000.005658
Barium and its compoundsBarium sulfate7727-43-74.56946829.1000001.646561
Inorganic Silicon compoundsSilicon dioxide7631-86-90.0942160.6000000.033950
Magnesium and its compoundsTalc14807-96-60.4710793.0000000.169749
Organic compoundsOther organic compounds.0.5652953.6000000.203698
PolymersPlastic: EP - Epoxide, Epoxy3.06201519.5000001.103366
PolymersPlastic: PAK6.92486444.1000002.495304
Subtotal15.702640100.00000005.658286
Substrate CoreInorganic Silicon compoundsFibrous-glass-wool65997-17-37.78165048.5300002.804038
Inorganic Silicon compoundsSilica, vitreous60676-86-00.7071314.4100000.254808
PolymersPlastic: PI - Polyimide7.54593947.0600002.719102
Subtotal16.034720100.00000005.777948
Total277.515841100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 SPC5744CFK1ACMH6
Product content declaration of SPC5744CFK1ACMH6
上次修订 Last Revision (GMT):
Monday, 10 November 2025, 12:32:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)邻苯二甲酸二正丁酯(DBP)邻苯二甲酸二异丁酯(DIBP)邻苯二甲酸丁基苄酯(BBP)邻苯二甲酸二(2-乙基)己酯(DEHP)
焊丝-铜钯
Bonding Wire - CuPd
焊丝-铜钯
Bonding Wire - CuPd
OOOOOO
芯片密封胶
Die Encapsulant
芯片密封胶
Die Encapsulant
OOOOOO
环氧树脂粘合剂
Epoxy Adhesive
环氧树脂粘合剂
Epoxy Adhesive
OOOOOO
半导体芯片
Semiconductor Die
半导体芯片
Semiconductor Die
OOOOOO
焊锡球-无铅
Solder Ball - Lead Free
焊锡球-无铅
Solder Ball - Lead Free
OOOOOO
基板,镍金预镀
Substrate, Pre-plated NiAu
铜箔
Copper Foil
OOOOOO

镀铜
Copper Plating
OOOOOO

镀金材料
Gold Plating
OOOOOO

镀镍层
Nickel Plating
OOOOOO

阻焊层
Solder Mask
OOOOOO

有机基质芯
Substrate Core
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of SPC5744CFK1ACMH6Last Revision (GMT):
Monday, 10 November 2025, 12:32:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - CuPdTest Report
15 Aug 2025
Test Report
15 Aug 2025
Test Report
15 Aug 2025
Test Report
15 Aug 2025
Die EncapsulantTest Report
4 Aug 2025
Test Report
4 Aug 2025
Test Report
4 Aug 2025
Test Report
4 Aug 2025
Epoxy AdhesiveTest Report
8 Feb 2025
Test Report
8 Feb 2025
Test Report
8 Feb 2025
Test Report
8 Feb 2025
Semiconductor DieTest Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Test Report
19 Dec 2023
Solder Ball - Lead FreeTest Report
9 Jul 2025
Test Report
9 Jul 2025
Test Report
9 Jul 2025
Test Report
9 Jul 2025
Substrate, Pre-plated NiAuAU PLATINGTest Report
27 May 2020
Test Report
27 May 2020
Test Report
27 May 2020
Test Report
27 May 2020
AUS308Test Report
25 May 2025
Test Report
25 May 2025
Test Report
25 May 2025
Test Report
25 May 2025
COPPER FOILTest Report
7 Jan 2021
Test Report
7 Jan 2021
Test Report
14 Jan 2020
Test Report
14 Jan 2020
E679FG SERIESTest Report
7 Jan 2021
Test Report
7 Jan 2021
Test Report
7 Jan 2021
Test Report
14 Jan 2020
NI PLATINGTest Report
16 Apr 2020
Test Report
16 Apr 2020
Test Report
16 Apr 2020
Test Report
16 Apr 2020
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.