202108002I : MPC5777C Mask 2N45H and 3N45H Errata List Update AUG2021

NXP Semiconductors announces an errata update for the MPC5777C mask 2N45H and 3N45H errata revision August 2021. The errata document provides a detailed description of the changes. Changes are summarized below. New Errata: ERR010963: Flash: Memory accesses may be corrupted when flash is operating between 33MHz and 75MHz ERR050312: M_CAN: Debug message handling state machine not reset to Idle state when CCCR.INIT is set. ERR050575: eMIOS: Any Unified Channel running in OPWMCB mode may function improperly if the lead or trail dead time insertion features is used and its timebase is generated by Unified channel in MCB mode ERR050782: e200: Time Base TBU register contains wrong value during TBL rollover ERR050789: M_CAN: Dedicated Tx Buffers configured with the same Message ID are not transmitted in order of lowest buffer number first ERR051044: M_CAN: Transmission order of the Tx Queue buffers with the same Message ID is impacted by the PUT index functionality Updated Errata: ERR011235: EMIOS: Any Unified Channel running in OPWMB or OPWMCB mode may function improperly if the source counter bus is generated by Unified channel in MC mode ERR050246: FlexCAN: Receive Message Buffers may have its Code Field corrupted if the Receive FIFO function is used The MPC5777C mask 2N45H and 3N45H errata revision August 2021 are attached to this notice and can be found at: https://www.nxp.com/products/processors-and-microcontrollers/power-architecture/mpc5xxx-microcontrollers/ultra-reliable-mpc57xx-mcus/ultra-reliable-mpc5777c-mcu-for-automotive-and-industrial-engine-management:MPC5777C?tab=Documentation_Tab Corresponding ZVEI Delta Qualification Matrix ID: SEM-DS-02

变化的原因

Errata has been updated to provide additional technical clarification.

预期的影响

No changes were made to the current production device. The errata describe existing conditions identified on current production devices.No impact on form fit function reliability or quality.

受影响的部分