202008022I : PF8100_PF8200 Errata Update Rev 2.0 for Output Overshoot / Undershoot

NXP Semiconductors announces an errata update for the PF8100 and PF8200 devices which could potentially be affected by an observed errata condition. The errata sheet describes existing deviations from the data sheet identified on current production devices. Potential implications on customer applications are described. The updated document provides a detailed description of the changes. Changes are summarized below.Errata UpdateER101: Output overshoot / undershoot when enabling another regulator- Errata has been updated to capture additional conditions associated with ER101. - Complete behavior including workaround is described in the errata.- Severity Level: MediumThe errata ES_PF8100_PF8200 revision 2.0 is attached to this notice and can be found at: https://www.nxp.com/docs/en/errata/ES_PF8100_PF8200_2.pdfCorresponding ZVEI Delta Qualification Matrix ID: SEM-DS-02

变化的原因

Errata update has been released to capture additional conditions associated with ER101 which could potentially affect some PF8100 and PF8200 device configurations.

受影响产品的识别

Product identification does not change

预期的影响

数据表的修订: No impact to existing datasheet

Customer application should take into account the identified errata.No impact on form fit function reliability or quality - no change to existing device.

受影响的部分