201701031F01 : MCF52254AF80 Room Test Elimination at Final Test
NXP Semiconductors announces the room temperature test elimination from the Final Test production flow for MCF52254AF80. Room test performance is covered by the remaining Final Test production flow. The room test elimination has been successfully qualified according to NXP specifications.Current Production Final Test Flow:Hot - Room - QA gateNew Production Final Test Flow:Hot - QA gate
| PCN类型 | 更改类别 | 发行日期 | 生效日期 |
|---|---|---|---|
| Final Product Change Notification | Test process | 25-Mar-2017 | 23-Jun-2017 |
变化的原因
Improve capacity for optimized cycle time and delivery.
受影响产品的识别
Product identification does not change
预期的影响
There is no change to product form fit function or reliability
受影响的部分
| 零件号/ 12NC | 上次购买日期 | 上次交货日期 | 备件 |
|---|---|---|---|
|
MCF52254AF80 (935309316557) |
- | - | - |